HIGH-PERFORMANCE EQUIPMENT.
It’s missions:
- To gain in-depth understanding of the samples studied
- To guarantee precise results and diagnostics
- To predict and understand the behaviour of studied materials under a range of demands
- To gain more data to improve correlations, simulations and understanding of the phenomena studied
InS offers the following capacities:
- Ultimate Analysis (Components And Traces)
- Comparative Analysis (Quality Auditing)
- Unknown Parts Analysis (Deformulation)
- Structural Analysis
SOME OF THE METHODS USED IN OUR LABORATORIES :
- ICP Inductively coupled plasma mass spectrometry. Identification and determination of formulation of the chemical components of your samples.
- FTIR (Fourier transform infrared spectrometry) Qualitative and quantitative determination of components of your samples.
- EDX SPECTROMETRY (energy dispersive X-ray analysis) Qualitative and quantitative and semi-quantitative elemental analysis on areas of a few microns, elemental mapping.
- TENSIOMETER Measuring properties of a liquid (surface tension, polarity components) and its interactions with given environments (solid, liquid or gas).
- HPLC (High Performance Liquid Chromatography) Enables qualitative and quantitative determination of organic compounds through separate analysis.
- LASER DIFFRACTION PARTICLE SIZING :Distribution of particles by size from 40nm.
- TGA-SDTA (combination of thermogravimetric analysis and differential thermal analysis) Study of behaviour of materials in temperatures up to 1500 degrees C.
- POTENTIOMETRIC-SPECIFIC ELECTRODES ANALYSIS :Assay of ions, water dosage using the Karl Fischer method, pH, ionic conductivity.
- CASTAING PROBE :Quantitative elemental analysis of the surfaces of your materials.
THANKS TO OUR PARTNER LABORATORIES WE CAN OFFER THE MOST APPROPRIATE ANALYSIS FOR ISSUES BEING DEAL WITH. BELOW ARE SOME EXAMPLES OF THE ANALYSIS THAT WE REGULAR CARRY OUT :
- GC/MS (Gas chromatography combined with mass spectrometry) Separate and quantitative analysis.
- TOF-SIMS :Time of flight-Secondary Ion Mass spectrometry. Makes it possible to identify and determine chemical compounds over a few nanometres.
- XPS (X–Ray Photoelectron Spectroscopy / ESCA) Elemental and functional analysis and chemical connections on extreme surfaces.
- ELS OR GDS Elemental analysis by light-emission spectrometry, with depth profiling.
- XRD SPECTROMETRY Qualitative and quantitative analysis of crystalline compounds.
- XRF Elemental quantitative and qualitative x-ray fluorescence analysis of solids.
- ATOMIC EMISSION SPECTROMETRY For analysing the composition of metals.
